RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions

10.1016/S0218-625X(01)00128-2

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Main Authors:	Wang, S.J., Ong, C.K., Xu, S.Y., Chen, P., Chai, J.W., Tjiu, W.C., Pan, J.S., Huan, A.C.H., Feng, W., Lim, J.S., Yoo, W.J., Choi, W.K.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82984
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82984
record_format	dspace
spelling	sg-nus-scholar.10635-829842024-11-12T22:38:22Z RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions Wang, S.J. Ong, C.K. Xu, S.Y. Chen, P. Chai, J.W. Tjiu, W.C. Pan, J.S. Huan, A.C.H. Feng, W. Lim, J.S. Yoo, W.J. Choi, W.K. ELECTRICAL & COMPUTER ENGINEERING INSTITUTE OF ENGINEERING SCIENCE PHYSICS 10.1016/S0218-625X(01)00128-2 Surface Review and Letters 8 5 521-526 SRLEF 2014-10-07T04:35:51Z 2014-10-07T04:35:51Z 2001 Article Wang, S.J.,Ong, C.K.,Xu, S.Y.,Chen, P.,Chai, J.W.,Tjiu, W.C.,Pan, J.S.,Huan, A.C.H.,Feng, W.,Lim, J.S.,Yoo, W.J.,Choi, W.K. (2001). RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions. Surface Review and Letters 8 (5) : 521-526. ScholarBank@NUS Repository. <a href="https://doi.org/10.1016/S0218-625X(01)00128-2" target="_blank">https://doi.org/10.1016/S0218-625X(01)00128-2</a> 0218625X http://scholarbank.nus.edu.sg/handle/10635/82984 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1016/S0218-625X(01)00128-2
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Wang, S.J. Ong, C.K. Xu, S.Y. Chen, P. Chai, J.W. Tjiu, W.C. Pan, J.S. Huan, A.C.H. Feng, W. Lim, J.S. Yoo, W.J. Choi, W.K.
format	Article
author	Wang, S.J. Ong, C.K. Xu, S.Y. Chen, P. Chai, J.W. Tjiu, W.C. Pan, J.S. Huan, A.C.H. Feng, W. Lim, J.S. Yoo, W.J. Choi, W.K.
spellingShingle	Wang, S.J. Ong, C.K. Xu, S.Y. Chen, P. Chai, J.W. Tjiu, W.C. Pan, J.S. Huan, A.C.H. Feng, W. Lim, J.S. Yoo, W.J. Choi, W.K. RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions
author_sort	Wang, S.J.
title	RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions
title_short	RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions
title_full	RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions
title_fullStr	RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions
title_full_unstemmed	RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions
title_sort	rheed and xps studies of the decomposition of silicon dioxide by the bombardment of metal ions
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82984
_version_	1821226569562062848

RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ions

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