Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements
10.1063/1.2721868
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sg-nus-scholar.10635-830442023-10-29T20:54:58Z Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements Wong, K.M. Chim, W.K. Ang, K.W. Yeo, Y.C. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2721868 Applied Physics Letters 90 15 - APPLA 2014-10-07T04:36:36Z 2014-10-07T04:36:36Z 2007 Article Wong, K.M., Chim, W.K., Ang, K.W., Yeo, Y.C. (2007). Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements. Applied Physics Letters 90 (15) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2721868 00036951 http://scholarbank.nus.edu.sg/handle/10635/83044 000245690700110 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
10.1063/1.2721868 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Wong, K.M. Chim, W.K. Ang, K.W. Yeo, Y.C. |
| format |
Article |
| author |
Wong, K.M. Chim, W.K. Ang, K.W. Yeo, Y.C. |
| spellingShingle |
Wong, K.M. Chim, W.K. Ang, K.W. Yeo, Y.C. Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| author_sort |
Wong, K.M. |
| title |
Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_short |
Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_full |
Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_fullStr |
Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_full_unstemmed |
Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_sort |
spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/83044 |
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1781784286776524800 |