Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films

Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films

10.1016/j.jmmm.2006.01.136

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書目詳細資料
Main Authors:	Li, K.B., Qiu, J.J., Luo, P., An, L.H., Guo, Z.B., Zheng, Y.K., Han, G.C., Wu, Y.H., Wang, S.J.
其他作者:	ELECTRICAL & COMPUTER ENGINEERING
格式:	Article
出版:	2014
主題:	Half metals Heusler alloy Magnetic tunneling junction Thermal stability
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/83093
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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