The effects of cap layers on electrical properties of indium nitride films

10.1063/1.3475400

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Bibliographic Details
Main Authors: Liu, W., Tan, R.J.N., Soh, C.B., Chua, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83167
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Institution: National University of Singapore

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