Understand NBTI mechanism by developing novel measurement techniques

Understand NBTI mechanism by developing novel measurement techniques

10.1109/TDMR.2007.912273

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Bibliographic Details
Main Authors: Li, M.-F., Huang, D., Shen, C., Yang, T., Liu, W.J., Liu, Z.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
CMOS
Negative bias temperature instability (NBTI)
Reliability
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83248
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Institution: National University of Singapore
id sg-nus-scholar.10635-83248
record_format dspace
spelling sg-nus-scholar.10635-832482023-10-30T07:12:22Z Understand NBTI mechanism by developing novel measurement techniques Li, M.-F. Huang, D. Shen, C. Yang, T. Liu, W.J. Liu, Z. ELECTRICAL & COMPUTER ENGINEERING CMOS Negative bias temperature instability (NBTI) Reliability 10.1109/TDMR.2007.912273 IEEE Transactions on Device and Materials Reliability 8 1 62-70 2014-10-07T04:39:02Z 2014-10-07T04:39:02Z 2008-03 Article Li, M.-F., Huang, D., Shen, C., Yang, T., Liu, W.J., Liu, Z. (2008-03). Understand NBTI mechanism by developing novel measurement techniques. IEEE Transactions on Device and Materials Reliability 8 (1) : 62-70. ScholarBank@NUS Repository. https://doi.org/10.1109/TDMR.2007.912273 15304388 http://scholarbank.nus.edu.sg/handle/10635/83248 000254069600008 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic CMOS
Negative bias temperature instability (NBTI)
Reliability
spellingShingle CMOS
Negative bias temperature instability (NBTI)
Reliability
Li, M.-F.
Huang, D.
Shen, C.
Yang, T.
Liu, W.J.
Liu, Z.
Understand NBTI mechanism by developing novel measurement techniques
description 10.1109/TDMR.2007.912273
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Li, M.-F.
Huang, D.
Shen, C.
Yang, T.
Liu, W.J.
Liu, Z.
format Article
author Li, M.-F.
Huang, D.
Shen, C.
Yang, T.
Liu, W.J.
Liu, Z.
author_sort Li, M.-F.
title Understand NBTI mechanism by developing novel measurement techniques
title_short Understand NBTI mechanism by developing novel measurement techniques
title_full Understand NBTI mechanism by developing novel measurement techniques
title_fullStr Understand NBTI mechanism by developing novel measurement techniques
title_full_unstemmed Understand NBTI mechanism by developing novel measurement techniques
title_sort understand nbti mechanism by developing novel measurement techniques
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83248
_version_ 1781784342344761344

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