Understand NBTI mechanism by developing novel measurement techniques

• Main Authors: Li, M.-F., Huang, D., Shen, C., Yang, T., Liu, W.J., Liu, Z.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: CMOS; Negative bias temperature instability (NBTI); Reliability
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/83248
• Institution: National University of Singapore

10.1109/TDMR.2007.912273