A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors
10.1109/IEDM.2007.4418881
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2014
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sg-nus-scholar.10635-833842024-11-11T18:19:24Z A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors Tan, K.-M. Zhu, M. Fang, W.-W. Yang, M. Liow, T.-Y. Lee, R.T.P. Hoe, K.M. Tung, C.-H. Balasubramanian, N. Samudra, G.S. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING NUS NANOSCIENCE & NANOTECH INITIATIVE 10.1109/IEDM.2007.4418881 Technical Digest - International Electron Devices Meeting, IEDM 127-130 TDIMD 2014-10-07T04:40:37Z 2014-10-07T04:40:37Z 2007 Conference Paper Tan, K.-M., Zhu, M., Fang, W.-W., Yang, M., Liow, T.-Y., Lee, R.T.P., Hoe, K.M., Tung, C.-H., Balasubramanian, N., Samudra, G.S., Yeo, Y.-C. (2007). A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors. Technical Digest - International Electron Devices Meeting, IEDM : 127-130. ScholarBank@NUS Repository. https://doi.org/10.1109/IEDM.2007.4418881 01631918 http://scholarbank.nus.edu.sg/handle/10635/83384 000259347800026 Scopus |
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10.1109/IEDM.2007.4418881 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Tan, K.-M. Zhu, M. Fang, W.-W. Yang, M. Liow, T.-Y. Lee, R.T.P. Hoe, K.M. Tung, C.-H. Balasubramanian, N. Samudra, G.S. Yeo, Y.-C. |
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Conference or Workshop Item |
author |
Tan, K.-M. Zhu, M. Fang, W.-W. Yang, M. Liow, T.-Y. Lee, R.T.P. Hoe, K.M. Tung, C.-H. Balasubramanian, N. Samudra, G.S. Yeo, Y.-C. |
spellingShingle |
Tan, K.-M. Zhu, M. Fang, W.-W. Yang, M. Liow, T.-Y. Lee, R.T.P. Hoe, K.M. Tung, C.-H. Balasubramanian, N. Samudra, G.S. Yeo, Y.-C. A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors |
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Tan, K.-M. |
title |
A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors |
title_short |
A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors |
title_full |
A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors |
title_fullStr |
A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors |
title_full_unstemmed |
A new liner stressor with very high intrinsic stress (> 6 GPa) and low permittivity comprising diamond-like carbon (DLC) for strained p-channel transistors |
title_sort |
new liner stressor with very high intrinsic stress (> 6 gpa) and low permittivity comprising diamond-like carbon (dlc) for strained p-channel transistors |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/83384 |
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