Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation

Technical Digest - International Electron Devices Meeting

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Main Authors:	Loh, W.Y., Cho, B.C., Joo, M.S., Li, M.F., Chan, D.S.H., Mathew, S., Kwong, D.-L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83486
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-834862015-02-26T23:05:09Z Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation Loh, W.Y. Cho, B.C. Joo, M.S. Li, M.F. Chan, D.S.H. Mathew, S. Kwong, D.-L. ELECTRICAL & COMPUTER ENGINEERING Technical Digest - International Electron Devices Meeting 927-930 TDIMD 2014-10-07T04:41:45Z 2014-10-07T04:41:45Z 2003 Conference Paper Loh, W.Y.,Cho, B.C.,Joo, M.S.,Li, M.F.,Chan, D.S.H.,Mathew, S.,Kwong, D.-L. (2003). Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation. Technical Digest - International Electron Devices Meeting : 927-930. ScholarBank@NUS Repository. 01631918 http://scholarbank.nus.edu.sg/handle/10635/83486 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Technical Digest - International Electron Devices Meeting
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Loh, W.Y. Cho, B.C. Joo, M.S. Li, M.F. Chan, D.S.H. Mathew, S. Kwong, D.-L.
format	Conference or Workshop Item
author	Loh, W.Y. Cho, B.C. Joo, M.S. Li, M.F. Chan, D.S.H. Mathew, S. Kwong, D.-L.
spellingShingle	Loh, W.Y. Cho, B.C. Joo, M.S. Li, M.F. Chan, D.S.H. Mathew, S. Kwong, D.-L. Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation
author_sort	Loh, W.Y.
title	Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation
title_short	Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation
title_full	Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation
title_fullStr	Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation
title_full_unstemmed	Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation
title_sort	analysis of charge trapping and breakdown mechanism in high-k dielectrics with metal gate electrode using carrier separation
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/83486
_version_	1681089444835229696

Analysis of Charge Trapping and Breakdown Mechanism in High-K Dielectrics with Metal Gate Electrode Using Carrier Separation

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