Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric
10.1109/IEDM.2006.346776
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2014
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sg-nus-scholar.10635-835372015-01-08T17:31:14Z Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric Shen, C. Li, M.-F. Foo, C.E. Yang, T. Huang, D.M. Yaps, A. Samudra, G.S. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IEDM.2006.346776 Technical Digest - International Electron Devices Meeting, IEDM - TDIMD 2014-10-07T04:42:20Z 2014-10-07T04:42:20Z 2006 Conference Paper Shen, C.,Li, M.-F.,Foo, C.E.,Yang, T.,Huang, D.M.,Yaps, A.,Samudra, G.S.,Yeo, Y.-C. (2006). Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric. Technical Digest - International Electron Devices Meeting, IEDM : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IEDM.2006.346776" target="_blank">https://doi.org/10.1109/IEDM.2006.346776</a> 1424404398 01631918 http://scholarbank.nus.edu.sg/handle/10635/83537 NOT_IN_WOS Scopus |
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10.1109/IEDM.2006.346776 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Shen, C. Li, M.-F. Foo, C.E. Yang, T. Huang, D.M. Yaps, A. Samudra, G.S. Yeo, Y.-C. |
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Conference or Workshop Item |
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Shen, C. Li, M.-F. Foo, C.E. Yang, T. Huang, D.M. Yaps, A. Samudra, G.S. Yeo, Y.-C. |
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Shen, C. Li, M.-F. Foo, C.E. Yang, T. Huang, D.M. Yaps, A. Samudra, G.S. Yeo, Y.-C. Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric |
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Shen, C. |
title |
Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric |
title_short |
Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric |
title_full |
Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric |
title_fullStr |
Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric |
title_full_unstemmed |
Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric |
title_sort |
characterization and physical origin of fast vth transient in nbti of pmosfets with sion dielectric |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/83537 |
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1681089454159167488 |