Characterization of AlInGaN quaternary epilayers grown by metal organic chemical vapor deposition

• Main Authors: Liu, W., Soh, C.B., Chen, P., Chua, S.J.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: A1. Atomic force microscopy; A1. Composition pulling effect; A1. Photoluminescence; A1. V-pits; A1. X-ray diffraction; A3. Metalorganic chemical vapor deposition; B1. AlInGaN quaternary
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/83539
• Institution: National University of Singapore

10.1016/j.jcrysgro.2004.04.082