Investigation of etching properties of HfO based high-K dielectrics using inductively coupled plasma

10.1116/1.1705590

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Bibliographic Details
Main Authors: Chen, J., Yoo, W.J., Tan, Z.Y.L., Wang, Y., Chan, D.S.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83862
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Institution: National University of Singapore