Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs

Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs

10.1109/DRC.2004.1367763

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Bibliographic Details
Main Authors: Yu, D.S., Chin, A., Hung, B.F., Chen, W.J., Zhu, C.X., Li, M.-F., Zhu, S.Y., Kwong, D.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83910
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-839102015-01-08T04:21:31Z Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs Yu, D.S. Chin, A. Hung, B.F. Chen, W.J. Zhu, C.X. Li, M.-F. Zhu, S.Y. Kwong, D.L. ELECTRICAL & COMPUTER ENGINEERING 10.1109/DRC.2004.1367763 Device Research Conference - Conference Digest, DRC 21-22 2014-10-07T04:46:37Z 2014-10-07T04:46:37Z 2004 Conference Paper Yu, D.S.,Chin, A.,Hung, B.F.,Chen, W.J.,Zhu, C.X.,Li, M.-F.,Zhu, S.Y.,Kwong, D.L. (2004). Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs. Device Research Conference - Conference Digest, DRC : 21-22. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/DRC.2004.1367763" target="_blank">https://doi.org/10.1109/DRC.2004.1367763</a> 0780382846 15483770 http://scholarbank.nus.edu.sg/handle/10635/83910 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description 10.1109/DRC.2004.1367763
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Yu, D.S.
Chin, A.
Hung, B.F.
Chen, W.J.
Zhu, C.X.
Li, M.-F.
Zhu, S.Y.
Kwong, D.L.
format Conference or Workshop Item
author Yu, D.S.
Chin, A.
Hung, B.F.
Chen, W.J.
Zhu, C.X.
Li, M.-F.
Zhu, S.Y.
Kwong, D.L.
spellingShingle Yu, D.S.
Chin, A.
Hung, B.F.
Chen, W.J.
Zhu, C.X.
Li, M.-F.
Zhu, S.Y.
Kwong, D.L.
Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs
author_sort Yu, D.S.
title Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs
title_short Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs
title_full Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs
title_fullStr Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs
title_full_unstemmed Low workfunction fully suicided gate on SiO2/Si and LaAlO 3/GOI n-MOSFETs
title_sort low workfunction fully suicided gate on sio2/si and laalo 3/goi n-mosfets
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83910
_version_ 1681089522458165248

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