On the dominant interface trap generation process during hot-carrier stressing

Annual Proceedings - Reliability Physics (Symposium)

Saved in:

Bibliographic Details
Main Authors:	Ang, D.S., Ling, C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Ac stress Charge pumping current Hot carrier Interface trap Lightly doped drain MOSFET
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84038
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-84038
record_format	dspace
spelling	sg-nus-scholar.10635-840382015-01-06T20:43:30Z On the dominant interface trap generation process during hot-carrier stressing Ang, D.S. Ling, C.H. ELECTRICAL & COMPUTER ENGINEERING BACHELOR OF TECHNOLOGY PROGRAMME Ac stress Charge pumping current Hot carrier Interface trap Lightly doped drain MOSFET Annual Proceedings - Reliability Physics (Symposium) 412-418 ARLPB 2014-10-07T04:48:04Z 2014-10-07T04:48:04Z 2001 Conference Paper Ang, D.S.,Ling, C.H. (2001). On the dominant interface trap generation process during hot-carrier stressing. Annual Proceedings - Reliability Physics (Symposium) : 412-418. ScholarBank@NUS Repository. 00999512 http://scholarbank.nus.edu.sg/handle/10635/84038 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Ac stress Charge pumping current Hot carrier Interface trap Lightly doped drain MOSFET
spellingShingle	Ac stress Charge pumping current Hot carrier Interface trap Lightly doped drain MOSFET Ang, D.S. Ling, C.H. On the dominant interface trap generation process during hot-carrier stressing
description	Annual Proceedings - Reliability Physics (Symposium)
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ang, D.S. Ling, C.H.
format	Conference or Workshop Item
author	Ang, D.S. Ling, C.H.
author_sort	Ang, D.S.
title	On the dominant interface trap generation process during hot-carrier stressing
title_short	On the dominant interface trap generation process during hot-carrier stressing
title_full	On the dominant interface trap generation process during hot-carrier stressing
title_fullStr	On the dominant interface trap generation process during hot-carrier stressing
title_full_unstemmed	On the dominant interface trap generation process during hot-carrier stressing
title_sort	on the dominant interface trap generation process during hot-carrier stressing
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/84038
_version_	1681089545761718272

On the dominant interface trap generation process during hot-carrier stressing

Similar Items