Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer
10.1109/VLSIT.2012.6242479
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2014
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sg-nus-scholar.10635-842312024-11-08T19:06:12Z Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer Han, G. Su, S. Wang, L. Wang, W. Gong, X. Yang, Y. Ivana Guo, P. Guo, C. Zhang, G. Pan, J. Zhang, Z. Xue, C. Cheng, B. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/VLSIT.2012.6242479 Digest of Technical Papers - Symposium on VLSI Technology 97-98 DTPTE 2014-10-07T04:50:18Z 2014-10-07T04:50:18Z 2012 Conference Paper Han, G.,Su, S.,Wang, L.,Wang, W.,Gong, X.,Yang, Y.,Ivana,Guo, P.,Guo, C.,Zhang, G.,Pan, J.,Zhang, Z.,Xue, C.,Cheng, B.,Yeo, Y.-C. (2012). Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer. Digest of Technical Papers - Symposium on VLSI Technology : 97-98. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/VLSIT.2012.6242479" target="_blank">https://doi.org/10.1109/VLSIT.2012.6242479</a> 9781467308458 07431562 http://scholarbank.nus.edu.sg/handle/10635/84231 NOT_IN_WOS Scopus |
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10.1109/VLSIT.2012.6242479 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Han, G. Su, S. Wang, L. Wang, W. Gong, X. Yang, Y. Ivana Guo, P. Guo, C. Zhang, G. Pan, J. Zhang, Z. Xue, C. Cheng, B. Yeo, Y.-C. |
format |
Conference or Workshop Item |
author |
Han, G. Su, S. Wang, L. Wang, W. Gong, X. Yang, Y. Ivana Guo, P. Guo, C. Zhang, G. Pan, J. Zhang, Z. Xue, C. Cheng, B. Yeo, Y.-C. |
spellingShingle |
Han, G. Su, S. Wang, L. Wang, W. Gong, X. Yang, Y. Ivana Guo, P. Guo, C. Zhang, G. Pan, J. Zhang, Z. Xue, C. Cheng, B. Yeo, Y.-C. Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer |
author_sort |
Han, G. |
title |
Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer |
title_short |
Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer |
title_full |
Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer |
title_fullStr |
Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer |
title_full_unstemmed |
Strained germanium-tin (GeSn) N-channel MOSFETs featuring low temperature N +/P junction formation and GeSnO 2 interfacial layer |
title_sort |
strained germanium-tin (gesn) n-channel mosfets featuring low temperature n +/p junction formation and gesno 2 interfacial layer |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/84231 |
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1821206480481681408 |