Structure effects in the gate-all-around silicon nanowire MOSFETs

10.1109/EDSSC.2007.4450079

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Bibliographic Details
Main Author:	Liang, G.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84242
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-84242
record_format	dspace
spelling	sg-nus-scholar.10635-842422015-01-09T15:40:58Z Structure effects in the gate-all-around silicon nanowire MOSFETs Liang, G. ELECTRICAL & COMPUTER ENGINEERING 10.1109/EDSSC.2007.4450079 IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007 129-132 2014-10-07T04:50:25Z 2014-10-07T04:50:25Z 2007 Conference Paper Liang, G. (2007). Structure effects in the gate-all-around silicon nanowire MOSFETs. IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007 : 129-132. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/EDSSC.2007.4450079" target="_blank">https://doi.org/10.1109/EDSSC.2007.4450079</a> 1424406374 http://scholarbank.nus.edu.sg/handle/10635/84242 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	10.1109/EDSSC.2007.4450079
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Liang, G.
format	Conference or Workshop Item
author	Liang, G.
spellingShingle	Liang, G. Structure effects in the gate-all-around silicon nanowire MOSFETs
author_sort	Liang, G.
title	Structure effects in the gate-all-around silicon nanowire MOSFETs
title_short	Structure effects in the gate-all-around silicon nanowire MOSFETs
title_full	Structure effects in the gate-all-around silicon nanowire MOSFETs
title_fullStr	Structure effects in the gate-all-around silicon nanowire MOSFETs
title_full_unstemmed	Structure effects in the gate-all-around silicon nanowire MOSFETs
title_sort	structure effects in the gate-all-around silicon nanowire mosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/84242
_version_	1681089582623358976

Structure effects in the gate-all-around silicon nanowire MOSFETs

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