A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET

A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET

10.1109/LED.2003.815942

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Bibliographic Details
Main Authors: Ang, D.S., Ling, C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Others
Published: 2014
Subjects:
Charge pumping (CP) current
Hot-carrier stress
Interface state
MOSFET
Neutral electron trap
Online Access:http://scholarbank.nus.edu.sg/handle/10635/84385
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-843852024-11-08T18:01:36Z A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET Ang, D.S. Ling, C.H. ELECTRICAL & COMPUTER ENGINEERING Charge pumping (CP) current Hot-carrier stress Interface state MOSFET Neutral electron trap 10.1109/LED.2003.815942 IEEE Electron Device Letters 24 9 598-600 EDLED 2014-10-07T04:52:04Z 2014-10-07T04:52:04Z 2003-09 Others Ang, D.S., Ling, C.H. (2003-09). A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET. IEEE Electron Device Letters 24 (9) : 598-600. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2003.815942 07413106 http://scholarbank.nus.edu.sg/handle/10635/84385 000184924700024 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Charge pumping (CP) current
Hot-carrier stress
Interface state
MOSFET
Neutral electron trap
spellingShingle Charge pumping (CP) current
Hot-carrier stress
Interface state
MOSFET
Neutral electron trap
Ang, D.S.
Ling, C.H.
A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET
description 10.1109/LED.2003.815942
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Ang, D.S.
Ling, C.H.
format Others
author Ang, D.S.
Ling, C.H.
author_sort Ang, D.S.
title A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET
title_short A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET
title_full A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET
title_fullStr A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET
title_full_unstemmed A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET
title_sort reassessment of ac hot-carrier degradation in deep-submicrometer ldd n-mosfet
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/84385
_version_ 1821205449389637632

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