A numerical study of the effects of temperature, moisture and vapour pressure on delamination in a PQFP during solder reflow

Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004

Saved in:
Bibliographic Details
Main Authors: Guojun, H., Tay, A.A.O.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/85862
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore