Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

10.1016/j.colsurfa.2011.06.008

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書目詳細資料
Main Authors:	Kwek, J.W., Vakarelski, I.U., Ng, W.K., Heng, J.Y.Y., Tan, R.B.H.
其他作者:	CHEMICAL & BIOMOLECULAR ENGINEERING
格式:	Article
出版:	2014
主題:	Atomic force microscope Electrostatic forces Microparticles
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/89611
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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