Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
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sg-nus-scholar.10635-932682024-11-09T04:03:49Z Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching Low, C.H. Chin, W.S. Tan, K.L. Loh, F.C. Zhou, M. Zhong, Q.H. Chan, L.H. PHYSICS CHEMISTRY Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 39 1 14-19 JAPND 2014-10-16T08:22:20Z 2014-10-16T08:22:20Z 2000-01 Article Low, C.H.,Chin, W.S.,Tan, K.L.,Loh, F.C.,Zhou, M.,Zhong, Q.H.,Chan, L.H. (2000-01). Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 39 (1) : 14-19. ScholarBank@NUS Repository. 00214922 http://scholarbank.nus.edu.sg/handle/10635/93268 NOT_IN_WOS Scopus |
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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
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PHYSICS Low, C.H. Chin, W.S. Tan, K.L. Loh, F.C. Zhou, M. Zhong, Q.H. Chan, L.H. |
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Low, C.H. Chin, W.S. Tan, K.L. Loh, F.C. Zhou, M. Zhong, Q.H. Chan, L.H. |
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Low, C.H. Chin, W.S. Tan, K.L. Loh, F.C. Zhou, M. Zhong, Q.H. Chan, L.H. Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching |
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Low, C.H. |
title |
Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching |
title_short |
Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching |
title_full |
Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching |
title_fullStr |
Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching |
title_full_unstemmed |
Characterization of Si(100) surface after high density HBr/Cl2/O2 plasma etching |
title_sort |
characterization of si(100) surface after high density hbr/cl2/o2 plasma etching |
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2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/93268 |
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1821201519857369088 |