X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films

X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films

Chemical Physics Letters

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Bibliographic Details
Main Authors:	Kim, J.S., Ho, P.K.H., Thomas, D.S., Friend, R.H., Cacialli, F., Bao, G.-W., Li, S.F.Y.
Other Authors:	CHEMISTRY
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/95419
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Institution:	National University of Singapore

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