Applications of micro-Raman spectroscopy in salicide characterization for Si device fabrication

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

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Bibliographic Details
Main Authors: Zhao, F.F., Chen, S.Y., Shen, Z.X., Gao, X.S., Zheng, J.Z., See, A.K., Chan, L.H.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95812
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Institution: National University of Singapore
Description
Summary:Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures