Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation

10.1063/1.3253420

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Main Authors:	Chen, Q., Yang, M., Feng, Y.P., Chai, J.W., Zhang, Z., Pan, J.S., Wang, S.J.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/95853
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-958532023-10-27T08:01:39Z Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation Chen, Q. Yang, M. Feng, Y.P. Chai, J.W. Zhang, Z. Pan, J.S. Wang, S.J. PHYSICS 10.1063/1.3253420 Applied Physics Letters 95 16 - APPLA 2014-10-16T09:16:35Z 2014-10-16T09:16:35Z 2009 Article Chen, Q., Yang, M., Feng, Y.P., Chai, J.W., Zhang, Z., Pan, J.S., Wang, S.J. (2009). Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation. Applied Physics Letters 95 (16) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3253420 00036951 http://scholarbank.nus.edu.sg/handle/10635/95853 000271218200027 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.3253420
author2	PHYSICS
author_facet	PHYSICS Chen, Q. Yang, M. Feng, Y.P. Chai, J.W. Zhang, Z. Pan, J.S. Wang, S.J.
format	Article
author	Chen, Q. Yang, M. Feng, Y.P. Chai, J.W. Zhang, Z. Pan, J.S. Wang, S.J.
spellingShingle	Chen, Q. Yang, M. Feng, Y.P. Chai, J.W. Zhang, Z. Pan, J.S. Wang, S.J. Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation
author_sort	Chen, Q.
title	Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation
title_short	Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation
title_full	Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation
title_fullStr	Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation
title_full_unstemmed	Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation
title_sort	band offsets of hfo2 /zno interface: in situ x-ray photoelectron spectroscopy measurement and ab initio calculation
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/95853
_version_	1781786342342000640

Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation

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