Supervised vs unsupervised models: A holistic look at effort-aware just-in-time defect prediction
Effort-aware just-in-time (JIT) defect prediction aims at finding more defective software changes with limited code inspection cost. Traditionally, supervised models have been used; however, they require sufficient labelled training data, which is difficult to obtain, especially for new projects. Re...
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| Main Authors: | , , |
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| Format: | text |
| Language: | English |
| Published: |
Institutional Knowledge at Singapore Management University
2017
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| Subjects: | |
| Online Access: | https://ink.library.smu.edu.sg/sis_research/3920 |
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| Institution: | Singapore Management University |
| Language: | English |