Resolution performance of programmable proximity aperture MeV ion beam lithography system

An ion beam lithography system for light and heavy ions has been developed at the University of Jyväskylä's Accelerator Laboratory. The system employs a programmable proximity aperture to define the beam. The proximity aperture is made up of four Ta blades with precise straight edges that cut t...

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Main Authors: Sergey Gorelick, Timo Sajavaara, Mikko Laitinen, Nitipon Puttaraksa, Harry J. Whitlow
格式: Conference Proceeding
出版: 2018
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在線閱讀:https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=44449089706&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/61066
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機構: Chiang Mai University