CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS

by ANG DIING SHENP
Published 2020

The link between NBTI and TDDB of high-k gate P-MOSFETs

by Gao, Yuan, Ang, Diing Shenp
Published 2013

First principle investigation of electronic transport properties of the edge shaped graphene-porphine molecular junction device

by Kole, Abhisek, Ang, Diing Shenp
Published 2018

Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses

by Berco, Dan, Ang, Diing Shenp
Published 2020

Alteration of gate-oxide trap capture/emission time constants by channel hot-carrier effect in the metal-oxide-semiconductor field-effect transistor

by Ju, Xin, Ang, Diing Shenp
Published 2021

Bioinspired robotic vision with online learning capability and rotation-invariant properties

by Berco, Dan, Ang, Diing Shenp
Published 2022

Impact of Lanthanum on positive-bias temperature instability - insight from first-principles simulation

by Gu, Chen Jie, Ang, Diing Shenp
Published 2014

Impact of voltage-accelerated stress on hole trapping at operating condition

by Tung, Zhi Yan, Ang, Diing Shenp
Published 2018

Evolution of hole trapping in the oxynitride gate p-MOSFET subjected to negative-bias temperature stressing

by Boo, A. A., Ang, Diing Shenp
Published 2013

Bimodal weibull distribution of metal/high-κ gate stack TDDB-insights by scanning tunneling microscopy

by Yew, K. S., Bersuker, G., Ang, Diing Shenp
Published 2013

Interfacial chemistry and valence band offset between GaN and Al2O3 studied by X-ray photoelectron spectroscopy

by Duan, T. L., Pan, J. S., Ang, Diing Shenp
Published 2013

TiN-Mediated Multi-Level Negative Photoconductance of the ZrO2 Breakdown Path

by Zhou, Yu, Kawashima, Tomohito, Ang, Diing Shenp
Published 2017

Conductive Bridge Random Access Memory (CBRAM): challenges and opportunities for memory and neuromorphic computing applications

by Abbas, Haider, Li, Jiayi, Ang, Diing Shenp
Published 2022

On the evolution of switching oxide traps in the HfO2/TiN gate stack subjected to positive- and negative-bias temperature stressing

by Gao, Yuan, Ang, Diing Shenp, Gu, Chen Jie
Published 2014

Negative-bias temperature instability – insight from recent dynamic stress experiments

by Ang, Diing Shenp, Boo, A. A., Gao, Yuan
Published 2013

Optically reversible electrical soft-breakdown in wide-bandgap oxides — a factorial study

by Zhou, Yu, Ang, Diing Shenp, Kalaga, Pranav Sairam
Published 2019

A new method for enhancing high- k /metal-gate stack performance and reliability for high- k last integration

by Yew, K. S., Tang, L. J., Ang, Diing Shenp
Published 2013

An optoneuronic device with realistic retinal expressions for bioinspired machine vision

by Berco, Dan, Ang, Diing Shenp, Zhang, Hai Zhong
Published 2020

Visible light detection and memory capabilities in MgO/HfO bilayer-based transparent structure for photograph sensing

by Kumar, Dayanand, Kalaga, Pranav Sairam, Ang, Diing Shenp
Published 2021

New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing

by Boo, Ann Ann, Tung, Zhi Yan, Ang, Diing Shenp
Published 2018