CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS

بواسطة ANG DIING SHENP
منشور في 2020

The link between NBTI and TDDB of high-k gate P-MOSFETs

بواسطة Gao, Yuan, Ang, Diing Shenp
منشور في 2013

First principle investigation of electronic transport properties of the edge shaped graphene-porphine molecular junction device

بواسطة Kole, Abhisek, Ang, Diing Shenp
منشور في 2018

Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses

بواسطة Berco, Dan, Ang, Diing Shenp
منشور في 2020

Alteration of gate-oxide trap capture/emission time constants by channel hot-carrier effect in the metal-oxide-semiconductor field-effect transistor

بواسطة Ju, Xin, Ang, Diing Shenp
منشور في 2021

Bioinspired robotic vision with online learning capability and rotation-invariant properties

بواسطة Berco, Dan, Ang, Diing Shenp
منشور في 2022

Impact of Lanthanum on positive-bias temperature instability - insight from first-principles simulation

بواسطة Gu, Chen Jie, Ang, Diing Shenp
منشور في 2014

Impact of voltage-accelerated stress on hole trapping at operating condition

بواسطة Tung, Zhi Yan, Ang, Diing Shenp
منشور في 2018

Evolution of hole trapping in the oxynitride gate p-MOSFET subjected to negative-bias temperature stressing

بواسطة Boo, A. A., Ang, Diing Shenp
منشور في 2013

Bimodal weibull distribution of metal/high-κ gate stack TDDB-insights by scanning tunneling microscopy

بواسطة Yew, K. S., Bersuker, G., Ang, Diing Shenp
منشور في 2013

Interfacial chemistry and valence band offset between GaN and Al2O3 studied by X-ray photoelectron spectroscopy

بواسطة Duan, T. L., Pan, J. S., Ang, Diing Shenp
منشور في 2013

TiN-Mediated Multi-Level Negative Photoconductance of the ZrO2 Breakdown Path

بواسطة Zhou, Yu, Kawashima, Tomohito, Ang, Diing Shenp
منشور في 2017

Conductive Bridge Random Access Memory (CBRAM): challenges and opportunities for memory and neuromorphic computing applications

بواسطة Abbas, Haider, Li, Jiayi, Ang, Diing Shenp
منشور في 2022

On the evolution of switching oxide traps in the HfO2/TiN gate stack subjected to positive- and negative-bias temperature stressing

بواسطة Gao, Yuan, Ang, Diing Shenp, Gu, Chen Jie
منشور في 2014

Negative-bias temperature instability – insight from recent dynamic stress experiments

بواسطة Ang, Diing Shenp, Boo, A. A., Gao, Yuan
منشور في 2013

Optically reversible electrical soft-breakdown in wide-bandgap oxides — a factorial study

بواسطة Zhou, Yu, Ang, Diing Shenp, Kalaga, Pranav Sairam
منشور في 2019

A new method for enhancing high- k /metal-gate stack performance and reliability for high- k last integration

بواسطة Yew, K. S., Tang, L. J., Ang, Diing Shenp
منشور في 2013

An optoneuronic device with realistic retinal expressions for bioinspired machine vision

بواسطة Berco, Dan, Ang, Diing Shenp, Zhang, Hai Zhong
منشور في 2020

Visible light detection and memory capabilities in MgO/HfO bilayer-based transparent structure for photograph sensing

بواسطة Kumar, Dayanand, Kalaga, Pranav Sairam, Ang, Diing Shenp
منشور في 2021

New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing

بواسطة Boo, Ann Ann, Tung, Zhi Yan, Ang, Diing Shenp
منشور في 2018