Thermally stable fully silicided Hf silicide metal gate electrode

by PARK, CHANG SEO, CHO, BYUNG JIN
Published 2012

Method of fabricating a CMOS device with dual metal gate electrodes

by PARK, CHANG SEO, CHO, BYUNG JIN, BALASUBRAMANIAN, NARAYANAN T.
Published 2012

Design of lateral IGBT protection circuit for smart power integration

by Luo, Junyang, Liang, Yung C., Cho, Byung-Jin
Published 2014

Radiation-induced leakage current of ultra-thin gate oxide under X-ray lithography conditions

by Cho, Byung Jin, Kim, Sun Jung, Ling, C.H., Joo, Moon Sig, Yeo, In Seok
Published 2014

Radiation-induced leakage current of ultra-thin gate oxide under X-ray lithography conditions

by Cho, Byung Jin, Kim, Sun Jung, Ling, C.H., Joo, Moon Sig, Yeo, In Seok
Published 2014

Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias

by Ang, Chew-Hoe, Ling, Chung-Ho, Cheng, Zhi-Yuan, Kim, Sun-Jung, Cho, Byung-Jin
Published 2014

Study of quasi-breakdown mechanism in ultra-thin gate oxide by using DCIV technique

by Guan, Hao, Cho, Byung Jin, Li, M.F., He, Y.D., Xu, Zhen, Dong, Zhong
Published 2014