Development of photolithography for the fabrication of novel GaAs based devices and diamond-like film based devices

由 Prasad Krishnamachar.
出版 2011

Fabrication and characterization of microelectronic devices, circuits and systems IV

由 Chan, Pak Kwong., Prasad, Krishnamachar.
出版 2008

A system health indicator for the distributed minority and majority voting based redundancy scheme

由 Balasubramanian, Padmanabhan, Maskell, Douglas, Prasad, Krishnamachar
出版 2020

RESAC: a redundancy strategy involving approximate computing for error-tolerant applications

由 Balasubramanian, Padmanabhan, Maskell, Douglas Leslie, Prasad, Krishnamachar
出版 2024

Development of deep submicron HEMT MMIC for millimetre-wave applications

由 Ng, Geok Eng, Yuan, Xiaocong, Yoon, Soon Fatt, Radhakrishnan, K., Law, Choi Look, Ooi, Boon Siew, Prasad Krishnamachar
出版 2008

Fabrication and characterization of microelectronic devices, circuits and systems VI

由 Radhakrishnan, K.
出版 2008

Improvement of contact resistance through barrier metallization optimization

由 Goh, Edwin Beng Chye.
出版 2008

Improvement in speed performance through transistor process optimization

由 Zheng, You.
出版 2008

Study and characterization of low dielectric constant materials for interlayer dielectric applications

由 Narayanan, Babu
出版 2008

Source line resistance failure issues and process optimisation of self aligned source etch

由 Su, Julia Hui Fong.
出版 2008

Influence of cleaning process on gate oxide integrity

由 Liu, Qing Guang.
出版 2008

Significance of process exhaust system on wafer fab operation and its performance improvement

由 Vedachalam Natanasabapathy
出版 2008

Characterization of deep trench etch recipe

由 Tay, Chin Tiong.
出版 2008

Experimental study of copper contamination in VLSI technology

由 Tey, Shih Hwee.
出版 2008

Process capability index (CPK) improvement for NMOS transistor IDSAT of 0.3 micrometer technology

由 Goh, Beng Lee.
出版 2008

Characterization and reliability studies of oxides grown by wet and dry oxidations for 0.25 micrometer CMOS technology

由 Chow, Yew Tuck.
出版 2008

Device "S" leakage failure due to plasma damage

由 Tan, Siew Yoon.
出版 2008

Electromigration reliability of copper interconnect in submicron microelectronics application

由 Ang, Kian Ann
出版 2008

Characteristics of chemical mechanical polishing in advanced wafer processing

由 Huang, Wen Ke.
出版 2008

Power MOSFET yield improvement through the improvement and refinement of epitaxy process

由 Ng, Kin Meng.
出版 2008