Design, Automation, and Test in Europe
The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent histo...
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其他作者: | Lauwereins, Rudy |
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格式: | 圖書 |
語言: | English |
出版: |
Design
2017
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在線閱讀: | http://repository.vnu.edu.vn/handle/VNU_123/30263 |
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機構: | Vietnam National University, Hanoi |
語言: | English |
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