Multiple wavelength fringe analysis for surface profile measurements
Interferometry has been widely used for surface metrology because of their precision, reliability, and versatility. Although monochromatic-light interferometery can provide high sensitivity and resolution, but it fails to quantify largediscontinuities. Multiple-wavelength techniques have been succes...
Saved in:
Main Authors: | Upputuri, Paul Kumar, Pramanik, Manojit |
---|---|
Other Authors: | School of Chemical and Biomedical Engineering |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2019
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/104900 http://hdl.handle.net/10220/49156 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
3D surface profile measurement using LCD fringe projection
by: Quan, C., et al.
Published: (2014) -
Surface profile measurement of low-frequency vibrating objects using temporal analysis of fringe pattern
by: Tay, C.J., et al.
Published: (2014) -
Applications of higher-order phase shifting algorithms for multiple-wavelength metrology
by: Upputuri, Paul Kumar, et al.
Published: (2019) -
iFringe : a fringe analysis application for mobile smart devices
by: Qian, Kemao, et al.
Published: (2018) -
Modeling the measurement precision of fringe projection profilometry
by: Lv, Shenzhen, et al.
Published: (2024)