Applications of higher-order phase shifting algorithms for multiple-wavelength metrology

Multiple-wavelength interferometric techniques have been successfully used for large step-height and large deformation measurements. Also it could resolve the step height between smooth and rough surfaces which is not possible with single wavelength interferometry. Temporal phase shifting algorithm,...

Full description

Saved in:
Bibliographic Details
Main Authors: Upputuri, Paul Kumar, Pramanik, Manojit
Other Authors: School of Chemical and Biomedical Engineering
Format: Conference or Workshop Item
Language:English
Published: 2019
Subjects:
Online Access:https://hdl.handle.net/10356/104906
http://hdl.handle.net/10220/49473
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-104906
record_format dspace
spelling sg-ntu-dr.10356-1049062023-12-29T06:44:08Z Applications of higher-order phase shifting algorithms for multiple-wavelength metrology Upputuri, Paul Kumar Pramanik, Manojit School of Chemical and Biomedical Engineering Proceedings of SPIE - Quantitative Phase Imaging Engineering::Chemical engineering Phase Shifting Interferometry Multiple-wavelength Multiple-wavelength interferometric techniques have been successfully used for large step-height and large deformation measurements. Also it could resolve the step height between smooth and rough surfaces which is not possible with single wavelength interferometry. Temporal phase shifting algorithm, which requires a phase shifter such as PZT, has been widely used for accurate phase evolution in interferometry. The phase shifter needs to be calibrated at every wavelength if multiple wavelengths are used for measurement, it is a time consuming process. If phase shifter is not calibrated accurately, it can introduce phase shift errors. In this work, we will discuss various phase shifting algorithms, and their tolerance for phase shift error. And the applications of higher-order phased shifting algorithms will be presented. The study is useful for multiple-wavelength and white light interferometry where more than one wavelength is used for optical phase measurements. NMRC (Natl Medical Research Council, S’pore) Accepted version 2019-07-26T04:49:28Z 2019-12-06T21:42:23Z 2019-07-26T04:49:28Z 2019-12-06T21:42:23Z 2019-03-01 2019 Conference Paper Upputuri, P. K., & Pramanik, M. (2019). Applications of higher-order phase shifting algorithms for multiple-wavelength metrology. Proceedings of SPIE - Quantitative Phase Imaging. doi:10.1117/12.2511942 https://hdl.handle.net/10356/104906 http://hdl.handle.net/10220/49473 10.1117/12.2511942 209817 en © 2019 Society of Photo-optical Instrumentation Engineers (SPIE). All rights reserved. This paper was published in Proceedings of SPIE - Quantitative Phase Imaging and is made available with permission of Society of Photo-optical Instrumentation Engineers (SPIE). application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Chemical engineering
Phase Shifting Interferometry
Multiple-wavelength
spellingShingle Engineering::Chemical engineering
Phase Shifting Interferometry
Multiple-wavelength
Upputuri, Paul Kumar
Pramanik, Manojit
Applications of higher-order phase shifting algorithms for multiple-wavelength metrology
description Multiple-wavelength interferometric techniques have been successfully used for large step-height and large deformation measurements. Also it could resolve the step height between smooth and rough surfaces which is not possible with single wavelength interferometry. Temporal phase shifting algorithm, which requires a phase shifter such as PZT, has been widely used for accurate phase evolution in interferometry. The phase shifter needs to be calibrated at every wavelength if multiple wavelengths are used for measurement, it is a time consuming process. If phase shifter is not calibrated accurately, it can introduce phase shift errors. In this work, we will discuss various phase shifting algorithms, and their tolerance for phase shift error. And the applications of higher-order phased shifting algorithms will be presented. The study is useful for multiple-wavelength and white light interferometry where more than one wavelength is used for optical phase measurements.
author2 School of Chemical and Biomedical Engineering
author_facet School of Chemical and Biomedical Engineering
Upputuri, Paul Kumar
Pramanik, Manojit
format Conference or Workshop Item
author Upputuri, Paul Kumar
Pramanik, Manojit
author_sort Upputuri, Paul Kumar
title Applications of higher-order phase shifting algorithms for multiple-wavelength metrology
title_short Applications of higher-order phase shifting algorithms for multiple-wavelength metrology
title_full Applications of higher-order phase shifting algorithms for multiple-wavelength metrology
title_fullStr Applications of higher-order phase shifting algorithms for multiple-wavelength metrology
title_full_unstemmed Applications of higher-order phase shifting algorithms for multiple-wavelength metrology
title_sort applications of higher-order phase shifting algorithms for multiple-wavelength metrology
publishDate 2019
url https://hdl.handle.net/10356/104906
http://hdl.handle.net/10220/49473
_version_ 1787136640432472064