White light interferometer with color CCD for 3D-surface profiling of microsystems

White light interferometry (WLI) is a state-of-the-art technique for high resolution full-filed 3-D surface profiling of Microsystems. However, the WLI is rather slow, because the number of frames to be recorded and evaluated is large compared to the single wavelength phase shifting interferometry....

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Main Authors: Upputuri, Paul Kumar, Pramanik, Manojit, Nandigana, Krishna Mohan, Kothiyal, Mahendra Prasad
其他作者: School of Chemical and Biomedical Engineering
格式: Conference or Workshop Item
語言:English
出版: 2015
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在線閱讀:https://hdl.handle.net/10356/106899
http://hdl.handle.net/10220/25224
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機構: Nanyang Technological University
語言: English