White light interferometer with color CCD for 3D-surface profiling of microsystems
White light interferometry (WLI) is a state-of-the-art technique for high resolution full-filed 3-D surface profiling of Microsystems. However, the WLI is rather slow, because the number of frames to be recorded and evaluated is large compared to the single wavelength phase shifting interferometry....
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Main Authors: | , , , |
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格式: | Conference or Workshop Item |
語言: | English |
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2015
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在線閱讀: | https://hdl.handle.net/10356/106899 http://hdl.handle.net/10220/25224 |
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機構: | Nanyang Technological University |
語言: | English |
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