UV/O3 assisted InP/Al2O3–Al2O3/Si low temperature die to wafer bonding

Direct bonding of InP dies to Si wafer at low temperature utilizing Al2O3 high-κ dielectric as the interfacial material for homogeneous bonding is reported. The bonding technique is assisted with a UV/Ozone exposure for surface activation and the activation time is optimized for the various intermed...

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Main Authors: Anantha, P., Tan, Chuan Seng
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2015
主題:
在線閱讀:https://hdl.handle.net/10356/107400
http://hdl.handle.net/10220/25472
http://dx.doi.org/10.1007/s00542-015-2432-8
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