Thermal stress analysis of electronic packaging components

The stress and strain behaviour of surface-mounted electronic packaging components under temperature cycling fatigue and creep deformations was investigated by non-linear three dimensional finite element method. In this research, solder joints of a PQFP package with a corner lead and solder joints o...

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書目詳細資料
主要作者: See Toh, Chee Wai.
其他作者: Pang, John Hock Lye
格式: Theses and Dissertations
語言:English
出版: 2008
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在線閱讀:http://hdl.handle.net/10356/13448
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機構: Nanyang Technological University
語言: English
實物特徵
總結:The stress and strain behaviour of surface-mounted electronic packaging components under temperature cycling fatigue and creep deformations was investigated by non-linear three dimensional finite element method. In this research, solder joints of a PQFP package with a corner lead and solder joints of a CBGA package were studied.