Thermal stress and fatigue analysis of microelectronic packaging

62 p.

Saved in:
Bibliographic Details
Main Author: Tan, Meng Leong.
Other Authors: Pang Hock Lye, John
Format: Theses and Dissertations
Published: 2011
Subjects:
Online Access:http://hdl.handle.net/10356/47133
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University