Thermal stress and fatigue analysis of microelectronic packaging

62 p.

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Bibliographic Details
Main Author: Tan, Meng Leong.
Other Authors: Pang Hock Lye, John
Format: Theses and Dissertations
Published: 2011
Subjects:
Online Access:http://hdl.handle.net/10356/47133
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-471332023-03-11T17:29:23Z Thermal stress and fatigue analysis of microelectronic packaging Tan, Meng Leong. Pang Hock Lye, John Wang Yu Po School of Mechanical and Production Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging 62 p. A programme written by Robert Darveaux was downloaded and run using ANSYS™ 5.3 in this project to develop better understanding of mechanical failures in electronic packaging and SMT solder joints caused by mismatch of coefficient of thermal expansions between the materials. Simulation of thermal cycles which modern encapsulated IC chips such as Plastic Ball Grid Array (PBGA) DRAM chips are expected to experience was imposed on to the finite element model and results obtained were studied and analysed. Master of Science (Mechanics & Processing of Materials) 2011-12-27T06:28:00Z 2011-12-27T06:28:00Z 1998 1998 Thesis http://hdl.handle.net/10356/47133 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Electronic packaging
Tan, Meng Leong.
Thermal stress and fatigue analysis of microelectronic packaging
description 62 p.
author2 Pang Hock Lye, John
author_facet Pang Hock Lye, John
Tan, Meng Leong.
format Theses and Dissertations
author Tan, Meng Leong.
author_sort Tan, Meng Leong.
title Thermal stress and fatigue analysis of microelectronic packaging
title_short Thermal stress and fatigue analysis of microelectronic packaging
title_full Thermal stress and fatigue analysis of microelectronic packaging
title_fullStr Thermal stress and fatigue analysis of microelectronic packaging
title_full_unstemmed Thermal stress and fatigue analysis of microelectronic packaging
title_sort thermal stress and fatigue analysis of microelectronic packaging
publishDate 2011
url http://hdl.handle.net/10356/47133
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