Deep metric learning for visual understanding : an overview of recent advances

• المؤلفون الرئيسيون: Lu, Jiwen, Hu, Junlin, Zhou, Jie
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2020
• الموضوعات: Engineering::Electrical and electronic engineering; Neural Networks; Visualization
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/142292
• المؤسسة: Nanyang Technological University

Metric learning aims to learn a distance function to measure the similarity of samples, which plays an important role in many visual understanding applications. Generally, the optimal similarity functions for different visual understanding tasks are task specific because the distributions for data u...