Uncovering the indium filament revolution in transparent bipolar ito/siox/ito resistive switching memories
Transparent resistive switching random access memory (ReRAM) is of interest for the future integrated invisible circuitry. However, poor understanding of its working mechanism in transparent ReRAMs with the indium tin oxide (ITO) electrode is still a critical problem and will hinder its widespread a...
Saved in:
Main Authors: | Qian, Kai, Han, Xu, Li, Huakai, Chen, Tupei, Lee, Pooi See |
---|---|
Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2022
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/155166 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Digital ReRAM-based compute-in-memory design
by: Xu, Jiawei
Published: (2024) -
Crossbar-constrained technology mapping for ReRAM based in-memory computing
by: Bhattacharjee, Debjyoti, et al.
Published: (2021) -
Multi-valued and fuzzy logic realization using TaOx memristive devices
by: Bhattacharjee, Debjyoti, et al.
Published: (2018) -
Operando direct observation of filament formation in resistive switching devices enabled by a topological transformation molecule
by: Hou, Kunqi, et al.
Published: (2021) -
Synthesis and memristor effect of a forming-free zno nanocrystalline films
by: Tominov, R.V., et al.
Published: (2021)