GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform

An efficient monolithically integrated light source with complementary metal-oxide semiconductor (CMOS) compatibility remains the missing component to enable Si photonics for various applications. In particular, vertical-cavity-surface-emitting (VCSE) light sources, such as resonant cavity light-emi...

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Main Authors: Chen, Qimiao, Jung, Yongduck, Zhou, Hao, Wu, Shaoteng, Gong, Xiao, Huang, Yi-Chiau, Lee, Kwang Hong, Zhang, Lin, Nam, Donguk, Liu, Jian, Luo, Jun-Wei, Fan, Weijun, Tan, Chuan Seng
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2023
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Online Access:https://hdl.handle.net/10356/167163
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-1671632023-05-19T15:40:38Z GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform Chen, Qimiao Jung, Yongduck Zhou, Hao Wu, Shaoteng Gong, Xiao Huang, Yi-Chiau Lee, Kwang Hong Zhang, Lin Nam, Donguk Liu, Jian Luo, Jun-Wei Fan, Weijun Tan, Chuan Seng School of Electrical and Electronic Engineering Engineering::Electrical and electronic engineering::Microelectronics Vertical Cavity Light Sources An efficient monolithically integrated light source with complementary metal-oxide semiconductor (CMOS) compatibility remains the missing component to enable Si photonics for various applications. In particular, vertical-cavity-surface-emitting (VCSE) light sources, such as resonant cavity light-emitting diodes (RCLEDs) and vertical cavity surface-emitting lasers (VCSELs), are strong contenders due to their compact size, circular emission profile with low beam divergence, wafer-scale fabrication compatibility, high bandwidth and high coupling efficiency to fiber optic cables. We report the first demonstration of 8-inch wafer-scale GeSn/Ge multiple-quantum-well VCSE p-i-n structures and diodes for laser or light-emitting diode (LED) applications in Si photonics by wafer bonding and layer transfer techniques, which are challenging for all-epitaxy routes. Alternative dielectric layers (SiO2/SiN/SiO2), introduced by wafer bonding, under the emitting structure serve as the bottom mirror for the vertical cavity. The Ge0.92Sn0.08/Ge MQW layer is utilized to improve the material quality and to confine injected carries. As a result, more than 8× enhancement of light emission due to the vertical cavity resonance was demonstrated by photoluminescence spectroscopy. Besides, the spectral purity is enhanced by the single-mode cavity. The intensity of light emission is insensitive to the temperature range from 4 to 300 K and even becomes stronger at higher temperatures. The vertical cavity effect on the light emission is further verified by reflectivity spectroscopy and optical simulations. A positive gain can be achieved as indicated by optical gain calculations and an excellent carrier injection efficiency of the MQW VCSE diode is observed, showing its potential for electrically injected RCLEDs and VCSELs. Ministry of Education (MOE) National Research Foundation (NRF) Submitted/Accepted version This work was supported by National Research Foundation Singapore (NRF–CRP19–2017–01), Ministry of Education AcRF Tier 2 (T2EP50121-0001 (MOE-000180-01)) and Ministry of Education AcRF Tier 1 (2021-T1-002-031 (RG112/21)). 2023-05-18T01:35:26Z 2023-05-18T01:35:26Z 2023 Journal Article Chen, Q., Jung, Y., Zhou, H., Wu, S., Gong, X., Huang, Y., Lee, K. H., Zhang, L., Nam, D., Liu, J., Luo, J., Fan, W. & Tan, C. S. (2023). GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform. ACS Photonics. https://dx.doi.org/10.1021/acsphotonics.2c01934 2330-4022 https://hdl.handle.net/10356/167163 10.1021/acsphotonics.2c01934 en NRF–CRP19–2017–01 T2EP50121-0001 (MOE-000180-01) 2021-T1-002-031 (RG112/21) ACS Photonics This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Photonics, copyright © 2023 American Chemical Society, after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acsphotonics.2c01934. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Electrical and electronic engineering::Microelectronics
Vertical Cavity
Light Sources
spellingShingle Engineering::Electrical and electronic engineering::Microelectronics
Vertical Cavity
Light Sources
Chen, Qimiao
Jung, Yongduck
Zhou, Hao
Wu, Shaoteng
Gong, Xiao
Huang, Yi-Chiau
Lee, Kwang Hong
Zhang, Lin
Nam, Donguk
Liu, Jian
Luo, Jun-Wei
Fan, Weijun
Tan, Chuan Seng
GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform
description An efficient monolithically integrated light source with complementary metal-oxide semiconductor (CMOS) compatibility remains the missing component to enable Si photonics for various applications. In particular, vertical-cavity-surface-emitting (VCSE) light sources, such as resonant cavity light-emitting diodes (RCLEDs) and vertical cavity surface-emitting lasers (VCSELs), are strong contenders due to their compact size, circular emission profile with low beam divergence, wafer-scale fabrication compatibility, high bandwidth and high coupling efficiency to fiber optic cables. We report the first demonstration of 8-inch wafer-scale GeSn/Ge multiple-quantum-well VCSE p-i-n structures and diodes for laser or light-emitting diode (LED) applications in Si photonics by wafer bonding and layer transfer techniques, which are challenging for all-epitaxy routes. Alternative dielectric layers (SiO2/SiN/SiO2), introduced by wafer bonding, under the emitting structure serve as the bottom mirror for the vertical cavity. The Ge0.92Sn0.08/Ge MQW layer is utilized to improve the material quality and to confine injected carries. As a result, more than 8× enhancement of light emission due to the vertical cavity resonance was demonstrated by photoluminescence spectroscopy. Besides, the spectral purity is enhanced by the single-mode cavity. The intensity of light emission is insensitive to the temperature range from 4 to 300 K and even becomes stronger at higher temperatures. The vertical cavity effect on the light emission is further verified by reflectivity spectroscopy and optical simulations. A positive gain can be achieved as indicated by optical gain calculations and an excellent carrier injection efficiency of the MQW VCSE diode is observed, showing its potential for electrically injected RCLEDs and VCSELs.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Chen, Qimiao
Jung, Yongduck
Zhou, Hao
Wu, Shaoteng
Gong, Xiao
Huang, Yi-Chiau
Lee, Kwang Hong
Zhang, Lin
Nam, Donguk
Liu, Jian
Luo, Jun-Wei
Fan, Weijun
Tan, Chuan Seng
format Article
author Chen, Qimiao
Jung, Yongduck
Zhou, Hao
Wu, Shaoteng
Gong, Xiao
Huang, Yi-Chiau
Lee, Kwang Hong
Zhang, Lin
Nam, Donguk
Liu, Jian
Luo, Jun-Wei
Fan, Weijun
Tan, Chuan Seng
author_sort Chen, Qimiao
title GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform
title_short GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform
title_full GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform
title_fullStr GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform
title_full_unstemmed GeSn/Ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm Ge-on-insulator platform
title_sort gesn/ge multiquantum-well vertical-cavity surface-emitting p-i-n structures and diode emitters on a 200 mm ge-on-insulator platform
publishDate 2023
url https://hdl.handle.net/10356/167163
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