Development of void growth model during electromigration test

Electromigration (EM) has been researched extensively for the past 30 years. Despite the huge amount of research conducted, electromigration is not yet fully understood. Furthermore, results produced by some researchers are contradictory, which adds confusion onto the deficiency. The cause is mainly...

Full description

Saved in:
Bibliographic Details
Main Author: Yeo, Mei Chun.
Other Authors: Tan, Cher Ming
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3886
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University