Development of void growth model during electromigration test
Electromigration (EM) has been researched extensively for the past 30 years. Despite the huge amount of research conducted, electromigration is not yet fully understood. Furthermore, results produced by some researchers are contradictory, which adds confusion onto the deficiency. The cause is mainly...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Theses and Dissertations |
| Published: |
2008
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10356/3886 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Nanyang Technological University |