Characterization of failure in integrated circuit due to electrostatic discharge (ESD)

• Main Author: Goh, Jia Jun.
• Other Authors: Tan, Cher Ming
• Format: Final Year Project
• Language: English
• Published: 2010
• Subjects: DRNTU::Engineering
• Online Access: http://hdl.handle.net/10356/40490
• Institution: Nanyang Technological University

Electrostatic discharge (ESD) is the momentary electric current that flows between two objects of different electrical potentials. It is the result of static charge build-up on at least one of the objects, and this charge is often sufficiently large enough to cause catastrophic or latent defect fai...