Characterization of failure in integrated circuit due to electrostatic discharge (ESD)

• المؤلف الرئيسي: Goh, Jia Jun.
• مؤلفون آخرون: Tan, Cher Ming
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2010
• الموضوعات: DRNTU::Engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/40490
• المؤسسة: Nanyang Technological University

Electrostatic discharge (ESD) is the momentary electric current that flows between two objects of different electrical potentials. It is the result of static charge build-up on at least one of the objects, and this charge is often sufficiently large enough to cause catastrophic or latent defect fai...