Characterization of failure in integrated circuit due to electrostatic discharge (ESD)

Characterization of failure in integrated circuit due to electrostatic discharge (ESD)

Electrostatic discharge (ESD) is the momentary electric current that flows between two objects of different electrical potentials. It is the result of static charge build-up on at least one of the objects, and this charge is often sufficiently large enough to cause catastrophic or latent defect fai...

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書目詳細資料
主要作者:	Goh, Jia Jun.
其他作者:	Tan, Cher Ming
格式:	Final Year Project
語言:	English
出版:	2010
主題:	DRNTU::Engineering
在線閱讀:	http://hdl.handle.net/10356/40490
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	Nanyang Technological University
語言:	English

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