Studies on high-frequency noise characteristics in deep submicron NMOSFETs

RF noise characterstics of deep sub-micrometer MOSFETs are nvestigated in this work. The direct matrix method to extract the channel thermal noise and induced gate noise is analyzed. In deep sub micron NMOSFETs, the contributions from some extrinsic elements are small and can be neglected. The proce...

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Bibliographic Details
Main Author: Zeng, Rong
Other Authors: Wang Hong
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
Online Access:https://hdl.handle.net/10356/40925
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Institution: Nanyang Technological University
Language: English
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