Studies on high-frequency noise characteristics in deep submicron NMOSFETs

• المؤلف الرئيسي: Zeng, Rong
• مؤلفون آخرون: Wang Hong
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2010
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/40925
• المؤسسة: Nanyang Technological University

RF noise characterstics of deep sub-micrometer MOSFETs are nvestigated in this work. The direct matrix method to extract the channel thermal noise and induced gate noise is analyzed. In deep sub micron NMOSFETs, the contributions from some extrinsic elements are small and can be neglected. The proce...