Studies on high-frequency noise characteristics in deep submicron NMOSFETs

Studies on high-frequency noise characteristics in deep submicron NMOSFETs

RF noise characterstics of deep sub-micrometer MOSFETs are nvestigated in this work. The direct matrix method to extract the channel thermal noise and induced gate noise is analyzed. In deep sub micron NMOSFETs, the contributions from some extrinsic elements are small and can be neglected. The proce...

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書目詳細資料
主要作者:	Zeng, Rong
其他作者:	Wang Hong
格式:	Theses and Dissertations
語言:	English
出版:	2010
主題:	DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
在線閱讀:	https://hdl.handle.net/10356/40925
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	Nanyang Technological University
語言:	English

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