Investigation and analysis of 1/f noise in sub-micron NMOS devices

• Main Author: Hla Myo.
• Other Authors: Yeo, Kiat Seng
• Format: Theses and Dissertations
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
• Online Access: http://hdl.handle.net/10356/4363
• Institution: Nanyang Technological University

This thesis develops a systematic framework for the flicker noise measurement, characterization and simulation of deep sub-micron MOSFETs. In particular, the low frequency noise in 0.13 micrometer NMOS devices is investigated. The devices used throughout this project have been fabricated according t...