Application of phase shift masking to sub-0.13 micron lithography

The main contribution of this thesis is to investigate the application of PSM, combined with other forms of RET, such as OAI and OPC, to poly gate patterning.

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Bibliographic Details
Main Author: Koo, Chee Kiong.
Other Authors: Yuan, Larry X.-C.
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/4521
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-45212023-07-04T16:39:08Z Application of phase shift masking to sub-0.13 micron lithography Koo, Chee Kiong. Yuan, Larry X.-C. School of Electrical and Electronic Engineering Tam, Siu Chung DRNTU::Engineering::Electrical and electronic engineering::Microelectronics The main contribution of this thesis is to investigate the application of PSM, combined with other forms of RET, such as OAI and OPC, to poly gate patterning. Master of Engineering 2008-09-17T09:53:09Z 2008-09-17T09:53:09Z 2002 2002 Thesis http://hdl.handle.net/10356/4521 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Koo, Chee Kiong.
Application of phase shift masking to sub-0.13 micron lithography
description The main contribution of this thesis is to investigate the application of PSM, combined with other forms of RET, such as OAI and OPC, to poly gate patterning.
author2 Yuan, Larry X.-C.
author_facet Yuan, Larry X.-C.
Koo, Chee Kiong.
format Theses and Dissertations
author Koo, Chee Kiong.
author_sort Koo, Chee Kiong.
title Application of phase shift masking to sub-0.13 micron lithography
title_short Application of phase shift masking to sub-0.13 micron lithography
title_full Application of phase shift masking to sub-0.13 micron lithography
title_fullStr Application of phase shift masking to sub-0.13 micron lithography
title_full_unstemmed Application of phase shift masking to sub-0.13 micron lithography
title_sort application of phase shift masking to sub-0.13 micron lithography
publishDate 2008
url http://hdl.handle.net/10356/4521
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