Characterizations of GaN-based high-electron-mobility-transistors (hemts)

Studies on the characteristics of AlGaN/GaN high-electron-mobility transistor (HEMTs) were performed based on the interest of understanding and evaluation of the device performance. This report will focus on the studies of drain current collapse issue on the GaN based HEMTs under the influence of di...

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書目詳細資料
主要作者: Wong, Wei Jie.
其他作者: Ng Geok Ing
格式: Final Year Project
語言:English
出版: 2012
主題:
在線閱讀:http://hdl.handle.net/10356/47701
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