Characterizations of GaN-based high-electron-mobility-transistors (hemts)
Studies on the characteristics of AlGaN/GaN high-electron-mobility transistor (HEMTs) were performed based on the interest of understanding and evaluation of the device performance. This report will focus on the studies of drain current collapse issue on the GaN based HEMTs under the influence of di...
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格式: | Final Year Project |
語言: | English |
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2012
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在線閱讀: | http://hdl.handle.net/10356/47701 |
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