Nanoscale characterization and analysis of localized degradation and breakdown of high-k dielectric stacks

• Main Author: Shubhakar.
• Other Authors: Pey Kin Leong
• Format: Theses and Dissertations
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• Online Access: http://hdl.handle.net/10356/53914
• Institution: Nanyang Technological University

Degradation and breakdown of high-κ (HK) dielectrics in advanced complementary metal-oxide-semiconductor (CMOS) technology node is one of the major challenges, due to its polycrystalline microstructure upon post-deposition annealing. Grain boundaries (GBs) in polycrystalline HK dielectrics with a hi...